Akrometrix announces their new Studio 10.1 update
Akrometrix, a leading provider of thermal warpage and strain metrology equipment, has released Studio 9.0, the latest update to its flagship software platform.
The new version introduces significant improvements, including enhanced Batch Interface Analysis for greater usability and scalability, image-based part tracking that allows parts to be tracked directly from image models, and an improved Z-Range mask function with a new histogram display.
Studio 9.0 also adds support for the company’s new TTDFP2 and TTSM-JS product lines, along with upgraded surface measurement, thermal profiling, and analysis features that enhance tools such as File Finder, Chord, and Feature Detection.
Akrometrix is offering a 20% discount on Studio 9.0 registrations through September 3, 2022. The update is designed to streamline thermal and surface metrology workflows for semiconductor and electronics manufacturers, improving precision, efficiency, and usability across both front- and back-end processes.
